[SPIE] High-NA EUV lithography exposure tool: program progress |
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2022-5-12
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A dual-layer direct/indirect flat panel detector for improved material decomposition: first studies of the indirect layer
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Experimental results of the first prototype direct-indirect dual-layer flat-panel detector for contrast-enhanced digital mammography and contrast-enhanced digital breast tomosynthesis
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Novel photonic quantum CNOT gates on the silicon chip
