journal£ºJournal of Semiconductors
Authors£ºHuabin Yu; Muhammad Hunain Memon; Hongfeng Jia; Haochen Zhang; Meng Tian; Shi Fang; Danhao Wang; Yang Kang; Shudan Xiao; Shibing Long; Haiding Sun
Published date£º2022-6-1
DOI£º10.1088/1674-4926/43/6/062801
PDF link£ºhttps://iopscience.iop.org/article/10.1088/1674-4926/43/6/062801
Article link£ºhttp://dx.doi.org/10.1088/1674-4926/43/6/062801
Article Source£ºIOP Publishing¡£
Remark£º |
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