journal£ºIEEE Transactions on Electron Devices
Authors£ºJinsu Jeong; Jun-Sik Yoon; Sanguk Lee; Rock-Hyun Baek
Published date£º2023-2-
DOI£º10.1109/ted.2022.3231839
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10003131
Article link£ºhttp://dx.doi.org/10.1109/ted.2022.3231839
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |