journal£ºIEEE Transactions on Industrial Electronics
Authors£ºKe Li; Wen Ding; Jiangnan Yuan; Changle Du
Published date£º2024-2-
DOI£º10.1109/tie.2023.3250748
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10061472
Article link£ºhttp://dx.doi.org/10.1109/tie.2023.3250748
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |